The leading point cloud engineering solution now available for interactive probing devices
PolyWorks/Inspector™ is renowned for its capability to combine point cloud 3D digitizing with traditional hard probing metrology. InnovMetric Software now introduces PolyWorks/Inspector Probing™, a new package specifically dedicated to interactive probing metrology applications.
PolyWorks/Inspector Probing offers:
Standard probing tools: alignment to CAD, probing of features and cross-sections, comparison to CAD surface and boundary, customizable reports, and more.
Unique probing functionalities including configurable flush & gap and profile gauge probing.
Free IGES, STEP, and STL translators.
Free plug-ins for a wide range of arm-based and hand-held probing devices, photogrammetry-based devices, and laser trackers.
PolyWorks/Inspector Probing handles up to 100,000 points.
The PolyWorks Advantage PolyWorks/Inspector Probing offers unique benefits to its users:
Easy upgrade path to the complete PolyWorks point cloud engineering solution.
A completely customizable Xtreme user interface platform that allows customers to quickly define their own visual layouts, including very simplified interfaces for their shop floor users.
Free viewer for sharing inspection results among users, managers, and suppliers.
Best after-sales support in the industry.
InnovMetric Software replicate a CMM-based inspection process using a 3D digitizer and PolyWorks.
InnovMetric Software was asked by world-leading jet engine manufacturer Pratt & Whitney Canada to replicate a traditional part inspection using PolyWorks and a 3D digitizer instead of a traditional Coordinate Measurement Machine (CMM). InnovMetric's applications engineers, in collaboration with the development team of Pratt & Whitney Canada, conducted a typical inspection of a diffuser pipe to evaluate the quality of the results obtained with PolyWorks and to compare them to those obtained with a CMM. The experiment successfully showed that PolyWorks can provide very accurate results in the fraction of the time needed for a regular probe-based process.